Call for Papers

Full CfP as text file: silm2024-cfp.txt

General topics of interest

Topics of interest include, but are not limited to the following:

  • Hardware reverse engineering
  • Microcode security analyses
  • Software side-channel attacks
  • Software attacks against micro-architecture
  • Software-activated fault attacks
  • Hardware-based security mechanisms
  • Software counter-measures against hardware vulnerabilities
  • Formal methods applied to the security of software/hardware interfaces
  • Hardware enclaves
  • Hardware trace mechanisms for security
  • OS and VM introspection

Submission guidelines

We accept two categories of submissions:

  1. Regular papers describing fully developed work and complete results (10 pages, references included, IEEE format)
  2. Short papers, position papers, industry experience reports, work-in- progress submissions and ideas (6 pages, references included, IEEE format; work-in-progress and idea submissions should clearly outline research hypothesis, evaluation strategy and potential impact)

All papers must be written in English and describe original work that has not been published or submitted elsewhere. The submission category (regular paper, short paper, special theme) should be clearly indicated. All submissions will be fully reviewed by members of the Program Committee. Papers will appear in IEEE Xplore in a companion volume to the regular EuroS&P proceedings. Contact the Program Chairs if you do *not* want your *short paper* to appear in the proceedings.

Papers must be typeset in LaTeX in A4 format (not “US Letter”) using the IEEE conference proceeding template we provide: eurosp-2023-template.zip We suggest you first compile the supplied LaTeX source as is, checking that you obtain the same PDF as the one supplied, and then write your paper into the LaTeX template, replacing the boilerplate text. Please do not use other IEEE templates. Failure to adhere to the page limit and formatting requirements can be grounds for rejection.

For accepted papers, at least one author must attend the workshop.